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27 Publications
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Kaushik Nayak
Associate Professor
Department of Electrical Engineering
knayak@ee.iith.ac.in (Work)
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Publications - 27
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Publications (27)
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Publications (27)
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Articles
TCAD Analysis of O-Terminated Diamond m-i-p+Diode Characteristics Dependencies on Surface States CNL and Metal-Induced Gap States
Y. Pullaiah
,
M. Bajaj
,
Oves Badami
and
Kaushik Nayak
2022 | Institute of Electrical and Electronics Engineers Inc.
Articles
Silicon-Germanium Heterojunction Bipolar Transistor DC and AC Analysis Operating under Cryogenic Temperature
D. Gupta
and
Kaushik Nayak
2022 | MDPI
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PDF
Publisher Copy
Articles
Contact Analysis of Elemental Transition Metal Electrodes for Complementary 2D-FET Applications Using MoS2and WSe2
K. Prashant
and
Kaushik Nayak
2022 | Institute of Electrical and Electronics Engineers Inc.
Articles
Electrode Orientation Dependent Transition Metal - (MoS; WS) Contact Analysis for 2D Material Based FET Applications
K. Prashant
,
D. Gupta
,
...
,
Oves Badami
and
Kaushik Nayak
(5 authors)
2021 | Institute of Electrical and Electronics Engineers Inc.
Articles
TCAD-Based Investigation of Statistical Variability Immunity in U-Channel FDSOI n-MOSFET for Sub-7-nm Technology
A. Sudarsanan
and
Kaushik Nayak
2021 | Institute of Electrical and Electronics Engineers Inc.
Articles
Electro-Thermal Performance Boosting in Stacked Si Gate-all-Around Nanosheet FET with Engineered Source/Drain Contacts
S. Venkateswarlu
,
Oves Badami
and
Kaushik Nayak
2021 | Institute of Electrical and Electronics Engineers Inc.
Articles
Immunity to random fluctuations induced by interface trap variability in Si gate-all-around n-nanowire field-effect transistor devices
A. Sudarsanan
and
Kaushik Nayak
2021 | Springer
Conferences
Superior Interface Trap Variability Immunity of Horizontally Stacked Si Nanosheet FET in Sub-3-nm Technology Node
A. Sudarsanan
,
Oves Badami
and
Kaushik Nayak
2021 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Device Electrostatics and High Temperature Operation of Oxygen Terminated Boron Doped Diamond MOS Capacitor and MOSFET
Y. Pullaiah
,
Naresh Emani
and
Kaushik Nayak
2020 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Atomistic Modeling to Engineer Ohmic Contacts between Monolayer MoS and Transition Metals
K. Prashant
,
P. Yerragudi
,
...
,
Kaushik Nayak
(4 authors)
2020 | Institute of Electrical and Electronics Engineers Inc.
Articles
Hetero-Interfacial Thermal Resistance Effects on Device Performance of Stacked Gate-All-Around Nanosheet FET
S. Venkateswarlu
and
Kaushik Nayak
2020 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Device SHEs in the Presence of Non-equilibrium Channel Heat Transport in SOI and SOD FinFETs with Technology Scaling
S. Venkateswarlu
and
Kaushik Nayak
2020 | Institute of Electrical and Electronics Engineers Inc.
Conferences
Superior Work Function Variability Performance of Horizontally Stacked Nanosheet FETs for Sub-7-nm Technology and beyond
A. Sudarsanan
,
S. Venkateswarlu
and
Kaushik Nayak
2020 | Institute of Electrical and Electronics Engineers Inc.
Articles
Ambient Temperature-Induced Device Self-Heating Effects on Multi-Fin Si CMOS Logic Circuit Performance in N-14 to N-7 Scaled Technologies
S. Venkateswarlu
and
Kaushik Nayak
2020 | Institute of Electrical and Electronics Engineers Inc.
Articles
Enhancement of the optical gain in GaAs nanocylinders for nanophotonic applications
J. Tapar
,
S. Kishen
,
...
,
Kaushik Nayak
and
Naresh Emani
(5 authors)
2020 | American Institute of Physics Inc.
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PDF
Publisher Copy
Conferences
THz Device Design for SiGe HBT under Sub-room Temperature to Cryogenic Conditions
D. Gupta
,
S. Venkateswarlu
,
Oves Badami
and
Kaushik Nayak
2020 | Institute of Electrical and Electronics Engineers Inc.
Articles
Impact of Fin Line Edge Roughness and Metal Gate Granularity on Variability of 10-nm Node SOI n-FinFET
A. Sudarsanan
,
S. Venkateswarlu
and
Kaushik Nayak
2019 | Institute of Electrical and Electronics Engineers Inc.
Articles
Ambient Temperature-Induced Device Self-Heating Effects on Multi-Fin Si n-FinFET Performance
S. Venkateswarlu
,
A. Sudarsanan
,
Kaushik Nayak
and
Shiv Govind Singh
2018 | Institute of Electrical and Electronics Engineers Inc.
Articles
Effect of Metal Gate Granularity Induced Random Fluctuations on Si Gate-All-Around Nanowire MOSFET 6-T SRAM Cell Stability
M. Bajaj
,
Kaushik Nayak
,
...
,
V.R. Rao
(4 authors)
2016 | Institute of Electrical and Electronics Engineers Inc.
Articles
Random dopant fluctuation induced variability in undoped channel si gate all around nanowire n-MOSFET
Kaushik Nayak
,
S. Agarwal
,
...
,
V.R. Rao
(5 authors)
2015 | Institute of Electrical and Electronics Engineers Inc.
Showing 1-20 of 27 results
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