Organic heterojunctions comprising of n-type fluorinated copper-phthalocyanine (F 16CuPc) and p-type cobalt-phthalocyanine (CoPc) layers were prepared on (001) LaAlO 3 substrates. In the entire temperature range of 300-30 K, F 16CuPc/CoPc heterojunctions showed an ohmic conduction with three order of magnitude lower resistivity than the individual layers. This indicates formation of a charge accumulation layer at the interface. Kelvin probe studies showed that charge accumulation layer is ∼10 nm thick on both the sides of the interface. © 2012 American Institute of Physics.