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To miss-attend is to misalign! Residual Self-Attentive Feature Alignment for Adapting Object Detectors
V. Khindkar, C. Arora, , A. Subramanian, R. Saluja, C.V. Jawahar
Published in Institute of Electrical and Electronics Engineers Inc.
2022
Pages: 376 - 386
Abstract
Advancements in adaptive object detection can lead to tremendous improvements in applications like autonomous navigation, as they alleviate the distributional shifts along the detection pipeline. Prior works adopt adversarial learning to align image features at global and local levels, yet the instance-specific misalignment persists. Also, adaptive object detection remains challenging due to visual diversity in background scenes and intricate combinations of objects. Motivated by structural importance, we aim to attend prominent instance-specific regions, overcoming the feature misalignment issue. We propose a novel resIduaL seLf-attentive featUre alignMEnt (ILLUME) method for adaptive object detection. ILLUME comprises Self-Attention Feature Map (SAFM) module that enhances structural attention to object-related regions and thereby generates domain invariant features. Our approach significantly reduces the domain distance with the improved feature alignment of the instances. Qualitative results demonstrate the ability of ILLUME to attend important object instances required for alignment. Experimental results on several benchmark datasets show that our method outperforms the existing state-of-the-art approaches. © 2022 IEEE.