Header menu link for other important links
X
Theory and practice of on-the-fly and ultra-fast VT measurements for NBTI degradation: Challenges and opportunities
Islam A.E., , Das H., Purawat S., Maheta V., Aono H., Murakami E., Mahapatra S., Alam M.A.
Published in
2007
Pages: 805 - 808
Abstract
On-the-fly and Ultra-fast VT are popular characterization techniques for analyzing NBTI degradation. We show that these techniques do not probe the intrinsic NBTI degradation directly and hence require suitable correction. The 'corrected' data allows us to explore the subtlety of relaxation dynamics by various measurements and suggest a theoretical basis for log-t relaxation consistent within R-D framework. © 2007 IEEE.
About the journal
JournalTechnical Digest - International Electron Devices Meeting, IEDM
ISSN01631918
Open AccessNo