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Surface roughness limited mobility in multi-gate FETs with arbitrary cross-section
, D. Lizzit, R. Specogna, D. Esseni
Published in Institute of Electrical and Electronics Engineers Inc.
2017
Pages: 36.1.1 - 36.1.4
Abstract
This paper presents the derivation, implementation and validation of a new model for Surface Roughness Scattering (SRS) in multi-gate FETs (MuGFETs) and gate-all-around nanowires (GAA-NW) FETs. The model employs a non linear relation between SRS matrix elements and interface fluctuations, that in planar MOSFETs allowed us to reconcile mobility simulations with experimental values for the r.m.s. interface roughness Δτη8 [1], [2]. The model is formulated for fairly arbitrary cross-sections and biasing conditions. © 2016 IEEE.
About the journal
JournalData powered by TypesetTechnical Digest - International Electron Devices Meeting, IEDM
PublisherData powered by TypesetInstitute of Electrical and Electronics Engineers Inc.
ISSN01631918