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Book Chapter
RTN and its intrinsic interaction with statistical variability sources in advanced nano-scale devices: A simulation study
F. Adamu-Lema
,
C. Monzio Compagnoni
,
Oves Badami
,
V. Georgiev
,
A. Asenov
Published in Springer International Publishing
2020
DOI:
10.1007/978-3-030-37500-3_13
Pages: 441 - 466
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Noise in Nanoscale Semiconductor Devices
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Springer International Publishing
Authors (1)
Oves Badami
Department of Electrical Engineering
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