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RTN and its intrinsic interaction with statistical variability sources in advanced nano-scale devices: A simulation study
F. Adamu-Lema, C. Monzio Compagnoni, , V. Georgiev, A. Asenov
Published in Springer International Publishing
2020
Pages: 441 - 466
About the journal
JournalData powered by TypesetNoise in Nanoscale Semiconductor Devices
PublisherData powered by TypesetSpringer International Publishing