Header menu link for other important links
X
Plasmon-induced charge transport at transition metal nitride-semiconductor interfaces via in situ nanoimaging
M.-W. Yu, S. Ishii, , N.K. Tanjaya, K.-P. Chen, T. Nagao
Published in The Optical Society
2021
Abstract
Photoexcited Kelvin probe force microscope is used to image hot carriers excited in transition metal nitride-semiconductor heterostructures. Both hot holes are hot electron injections are revealed depending on the carrier types of the semiconductors. © OSA 2021, © 2021 The Author(s)
About the journal
JournalData powered by TypesetOptics InfoBase Conference Papers
PublisherData powered by TypesetThe Optical Society
ISSN1084-7529
Impact Factor1.230
Citation Styleunsrt
Sherpa RoMEO Archiving PolicyGreen