Header menu link for other important links
X
Material dependence of NBTI physical mechanism in silicon oxynitride (SiON) p-MOSFETs: A comprehensive study by ultra-fast on-the-fly (UF-OTF) I DLIN technique
, Maheta V.D., Purawat S., Islam A.E., Olsen C., Ahmed K., Alam M.A., Mahapatra S.
Published in
2007
Pages: 809 - 812
Abstract
An Ultra-Fast On-The-Fly (UF-OTF) IDLIN technique having 1 μs resolution is developed and used to study gate insulator process dependence of NBTI in Silicon Oxynitride (SiON) p-MOSFETs. The Nitrogen density at the Si-SiON interface and the thickness of SiON layer are shown to impact temperature, time, and field dependencies of NBTI. The plausible material dependence of NBTI physical mechanism is explored. © 2007 IEEE.
About the journal
JournalTechnical Digest - International Electron Devices Meeting, IEDM
ISSN01631918
Open AccessNo