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Magnetization reversal studies of continuous and patterned exchange biased NiFe/FeMn thin films
, S. Vandezande, S. Brems, M.J. Van Bael, T. Charlton, S. Langridge, R.M. Dalgliesh, K. Temst, C. Van Haesendonck
Published in
2012
Volume: 109
   
Issue: 1
Pages: 181 - 187
Abstract
In this article we present a detailed investigation of the structural and magnetic properties of exchange biased NiFe (ferromagnet)/FeMn (antiferromagnet) thin films. The influence of the shape anisotropy on exchange bias and the magnetization reversal mechanism in a sample with patterned lines is compared with a continuous two-dimensional reference sample. Polarized neutron reflectivity (PNR) is employed to study the magnetization reversal by analyzing the spin-flip and non-spin-flip reflectivities. PNR measurements show that the magnetization reversal in the reference two-dimensional film and patterned lines is by domain wall motion rather than coherent rotation of magnetization. © 2012 Springer-Verlag.
About the journal
JournalApplied Physics A: Materials Science and Processing
ISSN09478396