Header menu link for other important links
X
Automated RRAM measurements using a semi-Automated probe station and ArC ONE interface
A.G. Panca, A. Serb, S. Stathopoulos, , T. Prodromakis
Published in Institute of Electrical and Electronics Engineers Inc.
2023
Volume: 2023-March
   
Abstract
Resistive Random Access Technology (RRAM) is quickly reaching industrial maturity. A key element towards achieving lasting commercial success, however, is automated testing; useful for performance benchmarking and rapid prototyping of new flavours of technology. Here we present a wafer-scale semi-Automated RRAM device testing platform. © 2023 IEEE.
About the journal
JournalIEEE International Conference on Microelectronic Test Structures
PublisherInstitute of Electrical and Electronics Engineers Inc.