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Automated RRAM measurements using a semi-Automated probe station and ArC ONE interface
A.G. Panca
,
A. Serb
,
S. Stathopoulos
,
Suresh Kumar Garlapati
,
T. Prodromakis
Published in Institute of Electrical and Electronics Engineers Inc.
2023
DOI:
10.1109/ICMTS55420.2023.10094156
Volume: 2023-March
Abstract
Resistive Random Access Technology (RRAM) is quickly reaching industrial maturity. A key element towards achieving lasting commercial success, however, is automated testing; useful for performance benchmarking and rapid prototyping of new flavours of technology. Here we present a wafer-scale semi-Automated RRAM device testing platform. © 2023 IEEE.
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Journal Details
Authors (1)
About the journal
Journal
IEEE International Conference on Microelectronic Test Structures
Publisher
Institute of Electrical and Electronics Engineers Inc.
Authors (1)
Suresh Kumar Garlapati
Department of Materials Science and Metallurgical Engineering
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