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An efficient heuristic for peak capture power minimization during scan-based test
A. Satya Trinadh, S. Potluri, , V. Kamakoti
Published in American Scientific Publishers
2013
Volume: 9
   
Issue: 2
Pages: 264 - 274
Abstract
IR-Drop induced timing failures during testing can be avoided by minimizing the peak capturepower. This paper models the Capture-Power minimization problem as an instance of the Bottleneck Traveling Salesman Path Problem (BTSPP). The solution for the BTSPP implies an ordering on the input test vectors, which when followed during testing minimizes the Peak Capture-Power. The paper also presents a methodology for estimating a lower bound on the peak capture-power. Applying the proposed technique on ITC'99 benchmarks yielded optimal (equal to the estimated lower bound) results for all circuits. Interestingly, the technique also significantly reduced the average power consumed during testing when compared with commercial state-of-the-art tools. Copyright © 2013 American Scientific Publishers All rights reserved.
About the journal
JournalData powered by TypesetJournal of Low Power Electronics
PublisherData powered by TypesetAmerican Scientific Publishers
ISSN15461998